Vikram Iyengar, Phil Nigh. Defect-Oriented Test for Ultra-Low DPM. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 455, IEEE Computer Society, 2005. [doi]
@inproceedings{IyengarN05,
title = {Defect-Oriented Test for Ultra-Low DPM},
author = {Vikram Iyengar and Phil Nigh},
year = {2005},
doi = {10.1109/ATS.2005.44},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.44},
tags = {testing},
researchr = {https://researchr.org/publication/IyengarN05},
cites = {0},
citedby = {0},
pages = {455},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}