Vikram Iyengar, Kenneth Pichamuthu, Andrew Ferko, Frank Woytowich, David E. Lackey, Gary Grise, Mark Taylor, Mike Degregorio, Steven F. Oakland. An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 173-178, IEEE Computer Society, 2007. [doi]
Abstract is missing.