Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
I. Izuddin, M. H. Kamaruddin, A. N. Nordin, N. Soin. Trench DMOS interface trap characterization by three-terminal charge pumping measurement. Microelectronics Reliability, 52(12):2914-2919, 2012. [doi]
Abstract is missing.