ProTest: A Low Cost Rapid Prototyping Test System for ASICs and FPGAs

Marcel Jacomet, Roger Wälti, Lukas Winzenried, Jaime Perez, Martin Gysel. ProTest: A Low Cost Rapid Prototyping Test System for ASICs and FPGAs. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 138-142, IEEE Computer Society, 1997. [doi]

@inproceedings{JacometWWPG97,
  title = {ProTest: A Low Cost Rapid Prototyping Test System for ASICs and FPGAs},
  author = {Marcel Jacomet and Roger Wälti and Lukas Winzenried and Jaime Perez and Martin Gysel},
  year = {1997},
  url = {http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090138abs.htm},
  tags = {testing},
  researchr = {https://researchr.org/publication/JacometWWPG97},
  cites = {0},
  citedby = {0},
  pages = {138-142},
  booktitle = {6th Asian Test Symposium (ATS  97), 17-18 November 1997, Akita, Japan},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-8209-4},
}