Marcel Jacomet, Roger Wälti, Lukas Winzenried, Jaime Perez, Martin Gysel. ProTest: A Low Cost Rapid Prototyping Test System for ASICs and FPGAs. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 138-142, IEEE Computer Society, 1997. [doi]
Abstract is missing.