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Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit

Thomas Jacquet, Grazia Sasso, Anjan Chakravorty, N. Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux. Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit. Microelectronics Reliability, 55(9-10):1433-1437, 2015. [doi]

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Thomas Jacquet

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Grazia Sasso

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Anjan Chakravorty

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N. Rinaldi

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Klaus Aufinger

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Thomas Zimmer

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Vincenzo d'Alessandro

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Cristell Maneux

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