Thomas Jacquet, Grazia Sasso, Anjan Chakravorty, N. Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux. Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit. Microelectronics Reliability, 55(9-10):1433-1437, 2015. [doi]
Abstract is missing.