Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press. Achieving High Test Quality with Reduced Pin Count Testing. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 312-317, IEEE Computer Society, 2005. [doi]
@inproceedings{JahangiriMCMP05,
title = {Achieving High Test Quality with Reduced Pin Count Testing},
author = {Jay Jahangiri and Nilanjan Mukherjee and Wu-Tung Cheng and Subramanian Mahadevan and Ron Press},
year = {2005},
doi = {10.1109/ATS.2005.19},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.19},
tags = {testing},
researchr = {https://researchr.org/publication/JahangiriMCMP05},
cites = {0},
citedby = {0},
pages = {312-317},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}