Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press. Achieving High Test Quality with Reduced Pin Count Testing. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 312-317, IEEE Computer Society, 2005. [doi]
Abstract is missing.