Poorvi Jain, Bishnu Prasad Das. Within-Die Threshold Voltage Variability Estimation Using Reconfigurable Ring Oscillator. In 30th International Conference on VLSI Design and 16th International Conference on Embedded Systems, VLSID 2017, Hyderabad, India, January 7-11, 2017. pages 315-320, IEEE Computer Society, 2017. [doi]
Abstract is missing.