Improved characterization of high speed continuous-time ΔΣ modulators using a duobinary test interface

Ankesh Jain, Shanthi Pavan. Improved characterization of high speed continuous-time ΔΣ modulators using a duobinary test interface. In 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, May 19-23, 2013. pages 1252-1255, IEEE, 2013. [doi]

Abstract

Abstract is missing.