Rajeewa Kumar Jaisawal, Sunil Rathore, P. N. Kondekar, Navjeet Bagga. Impact of Temperature on NDR Characteristics of a Negative Capacitance FinFET: Role of Landau Parameter (α). In Ambika Prasad Shah, Sudeb Dasgupta, Anand D. Darji, Jaynarayan T. Tudu, editors, VLSI Design and Test - 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers. Volume 1687 of Communications in Computer and Information Science, pages 97-106, Springer, 2022. [doi]
Abstract is missing.