Peter Jakobsen, Jeffrey Dreibelbis, Gary Pomichter, Darren Anand, John E. Barth Jr., Michael R. Nelms, Jeffrey Leach, George M. Belansek. Embedded DRAM built in self test and methodology for test insertion. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 975-984, IEEE Computer Society, 2001.
@inproceedings{JakobsenDPABNLB01,
title = {Embedded DRAM built in self test and methodology for test insertion},
author = {Peter Jakobsen and Jeffrey Dreibelbis and Gary Pomichter and Darren Anand and John E. Barth Jr. and Michael R. Nelms and Jeffrey Leach and George M. Belansek},
year = {2001},
tags = {testing},
researchr = {https://researchr.org/publication/JakobsenDPABNLB01},
cites = {0},
citedby = {0},
pages = {975-984},
booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
publisher = {IEEE Computer Society},
isbn = {0-7803-7169-0},
}