Utsav Jana, Sourav Banerjee, Binod Kumar 0001, Madhu B, Shankar Umapathi, Masahiro Fujita. Deep Learning-assisted Scan Chain Diagnosis with Different Fault Models during Manufacturing Test. In IEEE 31st Asian Test Symposium, ATS 2022, Taichung City, Taiwan, November 21-24, 2022. pages 72-77, IEEE, 2022. [doi]
Abstract is missing.