Investigation on reliability of interconnects in 3D heterogeneous systems by ageing beam resonance method

Grzegorz Janczyk, Tomasz Bieniek, J. Wasowski, Piotr Grabiec. Investigation on reliability of interconnects in 3D heterogeneous systems by ageing beam resonance method. Microelectronics Journal, 45(7):981-987, 2014. [doi]

Abstract

Abstract is missing.