BER Measurement of a 5.8-Gb/s/pin Unidirectional Differential I/O for DRAM Application With DIMM Channel

Young-Chan Jang, Hoeju Chung, Youngdon Choi, Hwan-Wook Park, Jaekwan Kim, Soouk Lim, Jung Sunwoo, Moon-Sook Park, Hyung-Seuk Kim, Sang Yun Kim, Yun Sang Lee, Woo-Seop Kim, Jung-Bae Lee, Jei-Hwan Yoo, Changhyun Kim. BER Measurement of a 5.8-Gb/s/pin Unidirectional Differential I/O for DRAM Application With DIMM Channel. J. Solid-State Circuits, 44(11):2987-2998, 2009. [doi]

Authors

Young-Chan Jang

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Hoeju Chung

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Youngdon Choi

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Hwan-Wook Park

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Jaekwan Kim

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Soouk Lim

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Jung Sunwoo

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Moon-Sook Park

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Hyung-Seuk Kim

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Sang Yun Kim

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Yun Sang Lee

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Woo-Seop Kim

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Jung-Bae Lee

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Jei-Hwan Yoo

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Changhyun Kim

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