Young-Chan Jang, Hoeju Chung, Youngdon Choi, Hwan-Wook Park, Jaekwan Kim, Soouk Lim, Jung Sunwoo, Moon-Sook Park, Hyung-Seuk Kim, Sang Yun Kim, Yun Sang Lee, Woo-Seop Kim, Jung-Bae Lee, Jei-Hwan Yoo, Changhyun Kim. BER Measurement of a 5.8-Gb/s/pin Unidirectional Differential I/O for DRAM Application With DIMM Channel. J. Solid-State Circuits, 44(11):2987-2998, 2009. [doi]
@article{JangCCPKLSPKKLK09,
title = {BER Measurement of a 5.8-Gb/s/pin Unidirectional Differential I/O for DRAM Application With DIMM Channel},
author = {Young-Chan Jang and Hoeju Chung and Youngdon Choi and Hwan-Wook Park and Jaekwan Kim and Soouk Lim and Jung Sunwoo and Moon-Sook Park and Hyung-Seuk Kim and Sang Yun Kim and Yun Sang Lee and Woo-Seop Kim and Jung-Bae Lee and Jei-Hwan Yoo and Changhyun Kim},
year = {2009},
doi = {10.1109/JSSC.2009.2028948},
url = {https://doi.org/10.1109/JSSC.2009.2028948},
researchr = {https://researchr.org/publication/JangCCPKLSPKKLK09},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {44},
number = {11},
pages = {2987-2998},
}