J. T. Jang, Y.-C. Kim, W. H. Bong, E. K. Kwon, B. J. Kwon, J. S. Jeon, H. G. Kim, I. H. Son. A new high-voltage tolerant I/O for improving ESD robustness. Microelectronics Reliability, 46(9-11):1634-1637, 2006. [doi]
No references recorded for this publication.
No citations of this publication recorded.