Error Tolerance of DNA Self-Assembly by Monomer Concentration Control

Byunghyun Jang, Yong-Bin Kim, Fabrizio Lombardi. Error Tolerance of DNA Self-Assembly by Monomer Concentration Control. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 89-97, IEEE Computer Society, 2006. [doi]

Abstract

Abstract is missing.