Deep Learning-Based Autonomous Scanning Electron Microscope - researchr publication authors

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Jonggyu Jang, Hyeonsu Lyu, Hyun Jong Yang, Moohyun Oh, Junhee Lee. Deep Learning-Based Autonomous Scanning Electron Microscope. In IEEE/RSJ International Conference on Intelligent Robots and Systems, IROS 2020, Las Vegas, NV, USA, October 24, 2020 - January 24, 2021. pages 2886-2893, IEEE, 2020. [doi]

This author has not been identified. Look up 'Jonggyu Jang' in GoogleThis author has not been identified. Look up 'Hyeonsu Lyu' in GoogleThis author has not been identified. Look up 'Hyun Jong Yang' in GoogleThis author has not been identified. Look up 'Moohyun Oh' in GoogleThis author has not been identified. Look up 'Junhee Lee' in Google

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