Chemical-Mechanical Polishing-Aware Application-Specific 3D NoC Design

Wooyoung Jang, David Z. Pan. Chemical-Mechanical Polishing-Aware Application-Specific 3D NoC Design. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(6):940-951, 2013. [doi]

@article{JangP13,
  title = {Chemical-Mechanical Polishing-Aware Application-Specific 3D NoC Design},
  author = {Wooyoung Jang and David Z. Pan},
  year = {2013},
  doi = {10.1109/TCAD.2013.2237771},
  url = {http://dx.doi.org/10.1109/TCAD.2013.2237771},
  researchr = {https://researchr.org/publication/JangP13},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {32},
  number = {6},
  pages = {940-951},
}