External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Experimental evaluation of hot electron reliability on differential Clapp-VCO

S.-L. Jang, J. S. Yuan, S. D. Yen, E. Kritchanchai, G. W. Huang. Experimental evaluation of hot electron reliability on differential Clapp-VCO. Microelectronics Reliability, 53(2):254-258, 2013. [doi]

Authors

S.-L. Jang

This author has not been identified. Look up 'S.-L. Jang' in Google

J. S. Yuan

This author has not been identified. Look up 'J. S. Yuan' in Google

S. D. Yen

This author has not been identified. Look up 'S. D. Yen' in Google

E. Kritchanchai

This author has not been identified. Look up 'E. Kritchanchai' in Google

G. W. Huang

This author has not been identified. Look up 'G. W. Huang' in Google
runs on