S.-L. Jang, J. S. Yuan, S. D. Yen, E. Kritchanchai, G. W. Huang. Experimental evaluation of hot electron reliability on differential Clapp-VCO. Microelectronics Reliability, 53(2):254-258, 2013. [doi]
@article{JangYYKH13,
title = {Experimental evaluation of hot electron reliability on differential Clapp-VCO},
author = {S.-L. Jang and J. S. Yuan and S. D. Yen and E. Kritchanchai and G. W. Huang},
year = {2013},
doi = {10.1016/j.microrel.2012.08.004},
url = {http://dx.doi.org/10.1016/j.microrel.2012.08.004},
researchr = {https://researchr.org/publication/JangYYKH13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {2},
pages = {254-258},
}