Lucas Janisch, Daniel Schulz, Alexander Schmidt, Raven Reisch, Tobias Kamps, Jörg Franke. Comparative Study of Keypoint Detection and ArUco Marker Methods for Optical 6D Pose Estimation in Electronics Packaging. In 20th IEEE International Conference on Automation Science and Engineering, CASE 2024, Bari, Italy, August 28 - Sept. 1, 2024. pages 3969-3974, IEEE, 2024. [doi]
Abstract is missing.