Piotr Jantos, Damian Grzechca, Jerzy Rutkowski. Global parametric faults identification with the use of Differential Evolution. In Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009, April 15-17, 2009, Liberec, Czech Republic. pages 222-225, IEEE Computer Society, 2009. [doi]
Abstract is missing.