Sylvie Jarrix, Laurent Dusseau, Nathalie Chatry, P. Hoffmann, Adrien Doridant, A. Blain, Tristan Dubois, Jeremy Raoult, Philippe Calvel. First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors. In 12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011. pages 1-4, IEEE, 2011. [doi]
@inproceedings{JarrixDCHDBDRC11,
title = {First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors},
author = {Sylvie Jarrix and Laurent Dusseau and Nathalie Chatry and P. Hoffmann and Adrien Doridant and A. Blain and Tristan Dubois and Jeremy Raoult and Philippe Calvel},
year = {2011},
doi = {10.1109/LATW.2011.5985894},
url = {https://doi.org/10.1109/LATW.2011.5985894},
researchr = {https://researchr.org/publication/JarrixDCHDBDRC11},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011},
publisher = {IEEE},
isbn = {978-1-4577-1490-0},
}