Sylvie Jarrix, Laurent Dusseau, Nathalie Chatry, P. Hoffmann, Adrien Doridant, A. Blain, Tristan Dubois, Jeremy Raoult, Philippe Calvel. First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors. In 12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011. pages 1-4, IEEE, 2011. [doi]
Abstract is missing.