Harnessing Biased Faults in Attacks on ECC-Based Signature Schemes - researchr publication authors

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Kimmo Järvinen, Céline Blondeau, Dan Page, Michael Tunstall. Harnessing Biased Faults in Attacks on ECC-Based Signature Schemes. In Guido Bertoni, Benedikt Gierlichs, editors, 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, Leuven, Belgium, September 9, 2012. pages 72-82, IEEE, 2012. [doi]

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Dan Page

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