Kimmo Järvinen, Céline Blondeau, Dan Page, Michael Tunstall. Harnessing Biased Faults in Attacks on ECC-Based Signature Schemes. In Guido Bertoni, Benedikt Gierlichs, editors, 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, Leuven, Belgium, September 9, 2012. pages 72-82, IEEE, 2012. [doi]
@inproceedings{JarvinenBPT12,
title = {Harnessing Biased Faults in Attacks on ECC-Based Signature Schemes},
author = {Kimmo Järvinen and Céline Blondeau and Dan Page and Michael Tunstall},
year = {2012},
doi = {10.1109/FDTC.2012.13},
url = {http://dx.doi.org/10.1109/FDTC.2012.13},
researchr = {https://researchr.org/publication/JarvinenBPT12},
cites = {0},
citedby = {0},
pages = {72-82},
booktitle = {2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, Leuven, Belgium, September 9, 2012},
editor = {Guido Bertoni and Benedikt Gierlichs},
publisher = {IEEE},
isbn = {978-1-4673-2900-2},
}