Degradation Of Nmosfets During High-Field Injection With Reverse Biased Voltage At Source And Drain Junctions - researchr publication authors

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R. K. Jarwal, Durga Misra. Degradation Of Nmosfets During High-Field Injection With Reverse Biased Voltage At Source And Drain Junctions. In 14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India. pages 485-490, IEEE Computer Society, 2001. [doi]

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