R. K. Jarwal, Durga Misra. Degradation Of Nmosfets During High-Field Injection With Reverse Biased Voltage At Source And Drain Junctions. In 14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India. pages 485-490, IEEE Computer Society, 2001. [doi]
@inproceedings{JarwalM01,
title = {Degradation Of Nmosfets During High-Field Injection With Reverse Biased Voltage At Source And Drain Junctions},
author = {R. K. Jarwal and Durga Misra},
year = {2001},
doi = {10.1109/ICVD.2001.902705},
url = {http://doi.ieeecomputersociety.org/10.1109/ICVD.2001.902705},
tags = {source-to-source, peer-to-peer, open-source},
researchr = {https://researchr.org/publication/JarwalM01},
cites = {0},
citedby = {0},
pages = {485-490},
booktitle = {14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-0831-6},
}