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Achieving Board-Level BIST Using the Boundary-Scan Master

Najmi T. Jarwala, Chi W. Yau. Achieving Board-Level BIST Using the Boundary-Scan Master. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 649-658, IEEE Computer Society, 1991.

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