Test vector decompression via cyclical scan chains and its application to testing core-based designs - researchr publication authors

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Abhijit Jas, Nur A. Touba. Test vector decompression via cyclical scan chains and its application to testing core-based designs. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 458-464, IEEE Computer Society, 1998. [doi]

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