Abhijit Jas, Nur A. Touba. Test vector decompression via cyclical scan chains and its application to testing core-based designs. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 458-464, IEEE Computer Society, 1998. [doi]
@inproceedings{JasT98,
title = {Test vector decompression via cyclical scan chains and its application to testing core-based designs},
author = {Abhijit Jas and Nur A. Touba},
year = {1998},
url = {http://www.computer.org/proceedings/itc/5093/50930458abs.htm},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/JasT98},
cites = {0},
citedby = {0},
pages = {458-464},
booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
isbn = {0-7803-5093-6},
}