Artjom Jasnetski, Stephen Adeboye Oyeniran, Anton Tsertov, Mario Schölzel, Raimund Ubar. High-level modeling and testing of multiple control faults in digital systems. In 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Kosice, Slovakia, April 20-22, 2016. pages 144-149, IEEE, 2016. [doi]
Abstract is missing.