Luc Jaulmes, Miquel Moretó, Mateo Valero, Marc Casas. A Vulnerability Factor for ECC-protected Memory. In Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos, editors, 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019. pages 176-181, IEEE, 2019. [doi]
Abstract is missing.