Pavan Kumar Javvaji, Spyros Tragoudas. A Method to Model Statistical Path Delays for Accurate Defect Coverage. In 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018, Chicago, IL, USA, October 8-10, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]
Abstract is missing.