A PVT resilient short-time measurement solution for on-chip testing

Esrafil Jedari, Rashid Rashidzadeh, Mehrdad Saif. A PVT resilient short-time measurement solution for on-chip testing. Microelectronics Journal, 75:35-40, 2018. [doi]

Authors

Esrafil Jedari

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Rashid Rashidzadeh

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Mehrdad Saif

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