Esrafil Jedari, Rashid Rashidzadeh, Mehrdad Saif. A PVT resilient short-time measurement solution for on-chip testing. Microelectronics Journal, 75:35-40, 2018. [doi]
@article{JedariRS18,
title = {A PVT resilient short-time measurement solution for on-chip testing},
author = {Esrafil Jedari and Rashid Rashidzadeh and Mehrdad Saif},
year = {2018},
doi = {10.1016/j.mejo.2018.02.005},
url = {https://doi.org/10.1016/j.mejo.2018.02.005},
researchr = {https://researchr.org/publication/JedariRS18},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {75},
pages = {35-40},
}