Efficient Test Pattern Compression Method Using Hard Fault Preferring - researchr publication authors

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Jiri Jenícek. Efficient Test Pattern Compression Method Using Hard Fault Preferring. In Luca Fanucci, editor, 11th Euromicro Conference on Digital System Design: Architectures, Methods and Tools, DSD 2008, Parma, Italy, September 3-5, 2008. pages 703-708, IEEE, 2008. [doi]

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