Jiri Jenícek. Efficient Test Pattern Compression Method Using Hard Fault Preferring. In Luca Fanucci, editor, 11th Euromicro Conference on Digital System Design: Architectures, Methods and Tools, DSD 2008, Parma, Italy, September 3-5, 2008. pages 703-708, IEEE, 2008. [doi]
@inproceedings{Jenicek08,
title = {Efficient Test Pattern Compression Method Using Hard Fault Preferring},
author = {Jiri Jenícek},
year = {2008},
doi = {10.1109/DSD.2008.88},
url = {http://dx.doi.org/10.1109/DSD.2008.88},
researchr = {https://researchr.org/publication/Jenicek08},
cites = {0},
citedby = {0},
pages = {703-708},
booktitle = {11th Euromicro Conference on Digital System Design: Architectures, Methods and Tools, DSD 2008, Parma, Italy, September 3-5, 2008},
editor = {Luca Fanucci},
publisher = {IEEE},
isbn = {978-0-7695-3277-6},
}