Maksim Jenihhin, Matteo Sonza Reorda, Aneesh Balakrishnan, Dan Alexandrescu. Challenges of Reliability Assessment and Enhancement in Autonomous Systems. In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.