Maksim Jenihhin, Jaan Raik, Anton Chepurov, Uljana Reinsalu, Raimund Ubar. High-Level Decision Diagrams based coverage metrics for verification and test. In 10th Latin American Test Workshop, LATW 2009, Rio de Janeiro, Brazil, March 2-5, 2009. pages 1-6, IEEE, 2009. [doi]
@inproceedings{JenihhinRCRU09,
title = {High-Level Decision Diagrams based coverage metrics for verification and test},
author = {Maksim Jenihhin and Jaan Raik and Anton Chepurov and Uljana Reinsalu and Raimund Ubar},
year = {2009},
doi = {10.1109/LATW.2009.4813792},
url = {https://doi.org/10.1109/LATW.2009.4813792},
researchr = {https://researchr.org/publication/JenihhinRCRU09},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {10th Latin American Test Workshop, LATW 2009, Rio de Janeiro, Brazil, March 2-5, 2009},
publisher = {IEEE},
isbn = {978-1-4244-4207-2},
}