Maksim Jenihhin, Jaan Raik, Anton Chepurov, Uljana Reinsalu, Raimund Ubar. High-Level Decision Diagrams based coverage metrics for verification and test. In 10th Latin American Test Workshop, LATW 2009, Rio de Janeiro, Brazil, March 2-5, 2009. pages 1-6, IEEE, 2009. [doi]
Abstract is missing.