Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros. Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. J. Electronic Testing, 32(3):273-289, 2016. [doi]
@article{JenihhinSCTKGVR16,
title = {Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits},
author = {Maksim Jenihhin and Giovanni Squillero and Thiago Santos Copetti and Valentin Tihhomirov and Sergei Kostin and Marco Gaudesi and Fabian Vargas and Jaan Raik and Matteo Sonza Reorda and Leticia Bolzani Poehls and Raimund Ubar and Guilherme Cardoso Medeiros},
year = {2016},
doi = {10.1007/s10836-016-5589-x},
url = {http://dx.doi.org/10.1007/s10836-016-5589-x},
researchr = {https://researchr.org/publication/JenihhinSCTKGVR16},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {32},
number = {3},
pages = {273-289},
}