Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros. Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits. J. Electronic Testing, 32(3):273-289, 2016. [doi]
Abstract is missing.