A Fast Built-in Redundancy Analysis for Memories With Optimal Repair Rate Using a Line-Based Search Tree

Woosik Jeong, Ilkwon Kang, Kyowon Jin, Sungho Kang. A Fast Built-in Redundancy Analysis for Memories With Optimal Repair Rate Using a Line-Based Search Tree. IEEE Trans. VLSI Syst., 17(12):1665-1678, 2009. [doi]

Abstract

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