Jae-woong Jeong, Sule Ozev, Friedrich Taenzler, Hui-Chuan Chao. Development and empirical verification of an accuracy model for the power down leakage tests. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-6, IEEE, 2014. [doi]
Abstract is missing.