Natasha Yogananda Jeppu, Tom Melham, Daniel Kroening. Active Learning of Abstract System Models from Traces using Model Checking. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 100-103, IEEE, 2022. [doi]
Abstract is missing.