Goeran Jerke, Jens Lienig. Hierarchical Current Density Verification for Electromigration Analysis in Arbitrary Shaped Metallization Patterns of Analog Circuits. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 464-469, IEEE Computer Society, 2002. [doi]
Abstract is missing.